An empirical X-ray K-Ratio framework for thickness measurement of 2D Si and SiO? thin films and SiO2 layer on Si substrate
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Author Name : |
ADEL AHMAD ABD-ELHAFIZ SHAHEEN |
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Title : |
An empirical X-ray K-Ratio framework for thickness measurement of 2D Si and SiO? thin films and SiO2 layer on Si substrate |
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Journal : |
Ultramicroscopy |
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Year : |
2026 |
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Research Area :
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material physics
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Journal URL :
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